Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot ...

Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...

(Nanowerk News) Metal-organic framework (MOF) nanocrystals are hybrid materials, built from metal clusters and organic linkers with an almost unlimited number of possible combinations. Their ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

IBM has pushed transistor density to a new extreme, fitting nearly 100 billion transistors onto a single chip roughly the ...

Carbon materials, such as carbon fibers and activated carbons, are essential across a wide variety of fields, encompassing everything from aerospace engineering to fuel cells and thermal insulation.

Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...