This course presents the fundamental principles of structural analysis, determination of reactions, internal forces and deflections under the static load conditions. The course is mainly focused to ...
The characterization of slice properties of electron bunches, such as slice emittance, slice-energy spread and beam-current profile, is very useful in a variety of contexts. In Free-Electron Lasers ...
Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, ...
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